VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...
Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...
The IEEE's Test Technology Technical Council (TTTC) has extended the deadline for paper submissions for the 2003 IEEE VLSI Test Symposium, slated for April 27 to May 1 in Napa Valley, CA. Paper ...
Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...
This course is broadly divided into two parts. Part one discusses the factors that cause system failures such as hardware defects, faults, noise, design errors and software bugs. Then a wide range of ...
Faults and Fault Modeling. System failures such as hardware defects, faults, noise, design errors, techniques for detecting manufacturing defects, design errors and faults. Combinational Logic Test ...
Weakness in the semiconductor industry pushed sales of IC wafer testing probe cards down to half of the five-year historic average, or 13.9%, in 2007 according to Santa Clara, Calif.-based market ...
This link below contains information about the Cadence design tools used extensively in classes in the Electrical and Computer Engineering Department at UMass Lowell. Students obtain practical ...
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